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Researcher
Niels Lambrecht
- Disciplines:Scientific computing, Computer theory, Computer hardware, Other computer engineering, information technology and mathematical engineering
Affiliations
- Department of Information technology (Department)
Member
From1 Aug 2014 → 23 Sep 2018
Publications
1 - 6 of 6
- Machine learning based error detection in transient susceptibility tests(2019)
Authors: Roberto Medico, Niels Lambrecht, Hugo Pues, Dries Vande Ginste, Dirk Deschrijver, Tom Dhaene, Domenico Spina
Pages: 352 - 360 - A circuit modeling technique for the ISO 7637-3 capacitive coupling clamp test(2018)
Authors: Niels Lambrecht, H. Pues, Daniël De Zutter, Dries Vande Ginste
Pages: 858 - 865 - Modeling of complex EMC test setups for the assessment of the transient behavior of automotive integrated circuits(2018)
Authors: Niels Lambrecht
- Modeling of contact bounce in a transient electromagnetic compatibility test for the analysis and optimization of nonlinear devices(2017)
Authors: Niels Lambrecht, H Pues, Daniël De Zutter, Dries Vande Ginste
Pages: 541 - 544 - Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test(2017)
Authors: Niels Lambrecht, Daniël De Zutter, Dries Vande Ginste, Hugo Pues
Pages: 1 - 5 - Efficient circuit modeling technique for the analysis and optimization of ISO 10605 field coupled Electrostatic Discharge (ESD) robustness of nonlinear devices(2016)
Authors: Niels Lambrecht, C. Gazda, H. Pues, Daniël De Zutter, Dries Vande Ginste
Pages: 971 - 980