Researcher
Jan De Beenhouwer
- Disciplines:Scientific computing, Computer theory, Computer hardware, Other computer engineering, information technology and mathematical engineering, Electronics
Affiliations
- Department of Electronics and information systems (Department)
Member
From1 Sep 2003 → 30 Sep 2012
Publications
1 - 10 of 20
- Fast GATE fan beam SPECT projector(2011)
Authors: Jan De Beenhouwer, Bart Pieters, Rik Van de Walle
Pages: 4188 - 4191 - Micro-CT contrast increase using regularized CT reconstruction(2011)
Authors: Bert Vandeghinste, Bart Goossens, Christian Vanhove, Jan De Beenhouwer, Roel Van Holen, Stefaan Vandenberghe, Steven Staelens, M Nyssen
Number of pages: 1 - Accurate Monte Carlo modelling of the back compartments of SPECT cameras(2011)
Authors: Erwann Rault, Steven Staelens, Roel Van Holen, Jan De Beenhouwer, Stefaan Vandenberghe
Pages: 87 - 104 - Absolute quantification in multi-pinhole micro-SPECT for different isotopes(2011)
Authors: Bert Vandeghinste, Christian Vanhove, Jan De Beenhouwer, Roel Van Holen, Stefaan Vandenberghe, Steven Staelens
Pages: 3720 - 3724 - Comparison of yttrium-90 SPECT and PET images(2010)Volume: 51
Authors: Erwann Rault, Enrico Clementel, Stefaan Vandenberghe, Yves D'Asseler, Roel Van Holen, Jan De Beenhouwer, Steven Staelens
Pages: 35 - 35 - Imaging Y-90 with microspect and microspect(2010)
Authors: Stefaan Vandenberghe, Steven Deleye, Jan De Beenhouwer, Larry van Elmbt, Steven Staelens, Bieke Lambert, Stephan Walrand
Number of pages: 1 - Fast gate multi-pinhole SPECT simulations(2010)
Authors: Jan De Beenhouwer, Steven Staelens
Pages: 3634 - 3637 - Fast 3D iterative image reconstruction for SPECT with rotating slat collimators(2009)
Authors: Roel Van Holen, Stefaan Vandenberghe, Steven Staelens, Jan De Beenhouwer, Ignace Lemahieu
Pages: 715 - 729 - Physics process level discrimination of detections for GATE: assessment of contamination in SPECT and spurious activity in PET(2009)
Authors: Jan De Beenhouwer, Steven Staelens, Stefaan Vandenberghe, Jeroen Verhaeghe, Roel Van Holen, Erwann Rault, Ignace Lemahieu
Pages: 053 - 1060 - Scatter effects of MR components in PET-MR inserts(2009)
Authors: Vincent Keereman, Stefaan Vandenberghe, Jan De Beenhouwer, Roel Van Holen, Steven Staelens, Volkmar Schulz, Torsten Solf, Bo Yu
Pages: 3804 - 3807