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Researcher
Marko Simicic
- Disciplines:Nanotechnology, Sensors, biosensors and smart sensors, Other electrical and electronic engineering, Design theories and methods
Affiliations
- Electronic Circuits and Systems (ECS) (Division)
Member
From1 Aug 2020 → 30 Sep 2018 - ESAT - MICAS, Microelectronics and Sensors (Division)
Member
From1 Dec 2012 → 30 Sep 2018
Projects
1 - 1 of 1
- Reliability-aware simulation and validation for analog/mixed-signal circuits in sub-32nm CMOSFrom3 Sep 2013 → 29 Aug 2018Funding: Own budget, for example: patrimony, inscription fees, gifts
Publications
1 - 10 of 18
- Understanding the Impact of Time-Dependent Random Variability on Analog ICs: From Single Transistor Measurements to Circuit Simulations(2019)
Authors: Marko Simicic, Georges Gielen
Pages: 601 - 610 - Concise Analytical Expression for Wunsch-Bell 1-D Pulsed Heating and Applications in ESD using TLP(2019)
Authors: Roman Boschke, Marko Simicic, Kris Myny, Peter Hellings
Number of pages: 6 - Reliability-aware simulation and validation for analog/mixed-signal circuits in sub-32nm CMOS(2018)
Authors: Marko Simicic, Georges Gielen, Guido Groeseneken
- Comphy - A compact-physics framework for unified modeling of BTI(2018)
Authors: G Rzepa, J Franco, B O'Sullivan, A Subirats, Marko Simicic, G Hellings, P Weckx, M Jech, T Knobloch, M Waltl, et al.
Pages: 49 - 65 - Self-heating-aware CMOS reliability characterization using degradation maps(2018)
Authors: Kent Chuang, Marko Simicic
Pages: 2A.31 - 2A.36 - A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability(2018)
Authors: Vamsi Putcha, Marko Simicic, Francky Catthoor
Pages: 186 - 194 - A fully-integrated method for RTN parameter extraction(2017)
Authors: Marko Simicic, Guido Groeseneken, Georges Gielen
Pages: T132 - T133Number of pages: 2 - Defect-based compact modeling for RTN and BTI variability(2017)
Authors: Marko Simicic
Number of pages: 6 - Statistical assessment of the full VG/VD degradation space using dedicated device arrays(2017)
Authors: Kent Chuang, Marko Simicic, Guido Groeseneken
Pages: 2 - Benchmarking time-dependent variability of junctionless nanowire FETs(2017)
Authors: Vamsi Putcha, Marko Simicic
Pages: 2